Web site last update is  7 February 2017


Technical stuff 
Yellow pages 





Welcome to EUFANET Web site


  What does EUFANET mean?

EUFANET stands for EUropean Failure Analysis NETwork


  What is EUFANET?

EUFANET is a network dedicated to failure analysis of electronic components (VLSI, other ICs, passives like resistors and actives like diodes or transistors, opto) and assembly (back-end, PCB, hybrids and connectors). The aim of this network is to boost technical information exchange for Failure Analysis community at European level.  more info



    Coming soon 26th and 27th April 2017, Save the Date!

CAM Workshop  - Innovation in Failure Analysis and Material Diagnostics of Electronics Components

The 6th CAM-Workshop will take place in Halle (Saale), Germany 26th and 27th April 2017.

System in Package and 3D integration are among the most significant key technologies to enable further miniaturization combined with increasing integration density and functionality of electronic systems.

These concepts are related to a rapidly growing device complexity in terms of new materials, 3D designs and high density interconnects, therefore causing many new challenges for reliability, quality and manufacturing yield. As a consequence also novel approaches of failure analysis and microstructure diagnostics are required that are capable of isolating and analyzing defects with higher sensitivity as well as improved spatial and depth resolution.

For these reasons, the 6th international CAM Workshop on Failure Analysis and Material Diagnostics of Electronics Components 2017, organized by Fraunhofer CAM in cooperation with EUFANET, is particularly focused on innovation in failure analysis methods and tools for system in package and 3D integration electronic devices.

Within the workshop also first outcome of the CATRENE / EURIPIDES project Smart Analysis Methods for 3D Integration in Advanced Microsystems and Corresponding Materials (SAM3) will be presented.

Following its tradition the workshop will bring together experts from semiconductor industry and failure analysis equipment manufacturers, allowing them to discuss current and upcoming technological needs together with the latest achievements in failure analysis results, methods and instrumentation during the presentations and at the workshop’s exhibition.

Furthermore, in 2017 Fraunhofer CAM can look back to 25 years of successful research activities in Halle, Germany. On this occasion, we will take the opportunity of the CAM workshop to celebrate our 25 anniversary together with long-standing and new industry and research partners!

More info on CAM Workshop web site http://www.cam-workshop.de/


IRPS 2017 will be held on April 2-6, 2017 at  Hyatt Regency Monterey Hotel and Spa, Monterey, California, USA

IEEE International Reliability Physics Symposium (IRPS) is the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment. IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world.

More info at IRPS web site: http://irps.org


The 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits ( IPFA 2017 ) is organized by the IEEE Reliability / CPMT / ED Singapore Chapter, IEEE Electron Devices Society Chengdu Chapter and the University of Electronic Science and Technology of China ( UESTC ) . The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society.

IPFA 2017 will be devoted to the fundamental understanding of the physical mechanisms governing failure in a large variety of advanced semeconductor devices and the electrical - physical failure analysis techniques, methodologies and tools that could be use to reliably identify the root cause of failure in these devices.

More info at IPFA 2017 web site: http://http://www.ipfa2017.com/


The European symposium on reliability of electronic devices failure physics and analysis ESREF 2017 will be held in Bordeaux – This South West French major town is the European capital for optical and laser engineering, with the so called “ Laser Mégajoule”, one of the most powerful lasers in the world.

Some of the largest companie involved in aeronautic and aerospace industry are located around Bordeaux. Dassault Falcon series private jets are built there as well as the French military aircraft Rafale; the Airbus A380 cockpit, the boosters of Ariane 5 ...

Bordeaux is located at the very heart of Southern Europe. It is part of the UNESCO World Heritage List, and classified as "City of Art and History”.

The University of Bordeaux is leading the “Initiative of Excellence” (Idex) program in association with national research organizations and higher educational institutes. 53 000 students take benefit of the multidisciplinary and international framework of the "Investments for the Future" program.

Hosting ESREF 2017 in this rich environment is a great opportunity since reliability in these particular applications is a very hot topic with strong challenges such as zero ppm failure and harsh environments.

For this 28th edition, in addition to the core topics of the conference, we would like to involve the major actors of aeronautics, space and embedded systems industry to provide specific topics such as radiation hardening, very long-term reliability, high/low temperature challenges, obsolescence and counterfeit issues, wide band gap power devices for the more electric aircraft and other embedded system applications.

We are looking forward to welcoming you for a memorable experience!

More info on ESREF 2017 website: http://www.esref.org


ISTFA 2017 will be held on November 5-9, 2017 at Pasadena Convention Center, Pasadena, CA, USA

Plan today to attend ISTFA 2017!  This year's theme is ‘Striving for 100% Success Rate'

More info at ISTFA 2017 web site: http://www.istfa.org



European FA Lab « Yellow Pages »

Eufanet is constructing a European Failure Analysis Laboratory List  which tries to contain all the labs with a list of techniques and capabilities in Europe that are in some way dedicated to failure analyse. The list is thought to be something like extended yellow pages and is open for every Lab somehow (even only slightly) related to failure analysis. It is free of charge and obligations, more information and to how to participate: yellow page





Copyright(c) 2001-2017 EUFANET. All rights reserved.