17th EUFANET Workshop will be held in conjunction with CAM at ESREF 2016 at Halle (Germany) on Wednesday, 21 September 2016, 09:30 – 18:10The topic this year is dedicated to automotivre electronics. CAM / EUFANET- Industry Workshop will focus on the important topic of automotive electronics from the system perspective. Future challenges arising from autonomous driving and the increased market performance of electric cars will be highlighted. Presentations this year include talks from car OEMs and leading component and system suppliers. More info
16th EUFANET Workshop has been held in conjunction with ESREF 2015 at Toulouse (France) on Wednesday October 7. The topic is "Failure Analysis of Critical Systems".
Systems failure occurs when a system does not meet its requirements. A laser failing to designate its target, an aerial refueling system failing to transfer fuel at the proper flow rate, a blood chemistry analyzer
failing to provide accurate test results, a munition that detonates prematurely, and other similar conditions are all systems failures. Systems failure analysis is an investigation to determine the underlying reasons for
the nonconformance to system requirements. Critical systems are systems which reliability is mandatory.Transmission control unit or brakes electronics in a car, computers in a satellite, Engine controls in a plane,
etc.. System level FA is quite complex as it has to apprehend system environment to understand the root cause of the failure, and usually harsh environment for plane, car, train, rockets, etc.. more info
15th EUFANET Workshop has been held in conjunction with ESREF 2014 at Berlin on Wednesday October 1st at 3:40 pm.
This workshop has been very active and we have enjoyed technical debates on copper sample preparation challenges and solutions. more info
14th EUFANET Workshop was held in conjunction with ESREF 2013 at Arcachon, the topic was "Sample prep challenges and solutions".
You are cordially invited to attend and actively participate in this workshop and enjoy technical debates on copper sample preparation challenges and solutions. more info
23rd European Symposium on Reliability of Electron Devices
has been held in Cagliari (Italy) from 1st to 5th
October 2012 .
A short EUFANET workshop will be held in conjunction
with ESREF. Topic was "Finding the open: from IC to assembly". more info
3rd extended Workshop 2012
You are kindly invited to contribute and attend the workshop on on “Smart Failure Analysis for New Materials in Electronic Devices” will be held on Monday September 17th (9:00 am – 6:30 pm) and Tuesday September 18th in 2012 (8:30 am – 6:00 pm) at the Fraunhofer CNT, Königsbrücker Strasse 180, 01099 Dresden, Germany. You are kindly invited to contribute to the Workshop on “Smart Failure Analysis for New Materials in Electronic Devices” (trends, challenges and solutions for tomorrow’s analysis of new technologies, materials and products). more info
ESREF 2011 has been held in Bordeaux, from 3 to 7 October 2011. As usual, we had a short EUFANET workshop in conjunction with ESREF. The topic of this EUFANET workshop is "Failure analysis mechanisms in Analog, Power and RF devices and applications" more info
2nd extended Workshop 2011
Extended workshop on challenges for three-dimensional (3D) Integrated Circuits and Systems (Design for test, manufacturing and failure analysis) has been held Monday, November 28, 2011 (9:00 am – 6:30 pm) and Tuesday, November 29, 2011 (8:30 am – 6:30 pm) at IAS conference room - 23 avenue Edouard Belin - Complexe Scientifique de Rangueil - 31400 Toulouse – France. more info
The 11th EUFANET workshop focused on Failure Analysis of Analog Devices. This workshop has been held during the ESREF 2010 conference in Gaeta, Italy. 40 people attended this exiting workshop where we had great technical exchanges and discussions which followed the presentations
The 10th EUFANET workshop focused on "How to Analyze 3D packages". It was held in Arcachon at ESREF 2009, on October 7 and has been a great success with 50 attendees.
1st extended Workshop 2009
Optical Localization Techniques Workshop in Toulouse has been a great success with 75 people pre-registered and more than 68 effectively attended despite the global economic downturn (travel restrictions) and Saturday storm in South West of France
The 8th EUFANET workshop focused on Practical Challenges of Nanoprobing for Transistor Level, Electrical Characterization. It has been held during the ESREF 2008 conference in Maastricht, Neederlands. 30 people attended this exiting workshop where we had great technical exchanges and discussions
The 7th EUFANET workshop was held during the ESREF 2007 conference in Arcachon, France, 45 people attended this exiting workshop where we had great technical exchanges and discussions on ESD, ESDFOS and EOS from a Failure Analysis point of view
The 6th EUFANET workshop has been held during the ESREF 2006 conference in Wuppertal, Germany. 49 people attended this exiting workshop focused on Failure Analysis of System in Package (SIP)
53 attendees were involved in the 5th Eufanet workshop in Arcachon (France) on Wednesday, October 12, 2005. The hot topic this year was "Diagnostic ATPG and CAD approaches for IC analysis”
The 4th EUFANET WORKSHOP was held at ETH institute in Zurich (Switzerland) . The hot topic was "Submicron 3D imaging, What we must see versus what we can see”,
It was the third EUFANET workshop, It took place at Arcachon during ESREF
2003 conference. It was mostly dedicated to hot topic on magnetic cartography