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Workshop 2010 Report

  The 11th EUFANET workshop focused on Failure Analysis of Analog Devices. This year’s workshop topic dealt with the characterisation and analysis of analog ICs. Many failure localisation techniques that have been honed over the years on digital devices are not, or no longer, applicable to analog units. On the other hand, analog circuitry is increasingly (and again!) prevalent in microelectronics as standalone devices, or in combination with MEMS sensors or short-distance RF transmissions. This workshop has been held during the ESREF 2010 conference in Gaeta, Italy. 40 people attended this exiting workshop where we had great technical exchanges and discussions which followed the presentations:


Welcome & Workshop introduction (Philippe Perdu, CNES)

EUFANET status (Jean-Philippe Roux, Sector Technologies)


Technical presentations:

Analog IC sample prep (Matthew Lefevre, Digit Concept)

Variation mapping for analog devices (Philippe Perdu, CNES; Olivier Crepel, Freescale)

Analogue measurement with emiscope (Frank Zachariasse, NXP)

Measuring transistors characteristics of sub-32nm devices with SEM-based nano-probing system (Stefan Kleindick, Kleindick)

Nanoprobing and CAFM for 16 nm elementary structures (Matthew Lefevre, Digit Concept)

Round table with the audience


We thank all the speakers for contributing to the EUFANET workshop. !



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